PicaMS Pty Ltd
MaterialS: picometre structure - nanotechnology - millimetre application

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Nano-characterisation

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Micro and nano characterisation of materials using scanning and transmission electron microscopy
                  
PicaMS provides a service in micro- and nano- characterisation of materials using scanning and transmission electron microscopy.  These electron beam techniques provide a highly versatile toolset for characterisation of materials structure in a sizes ranging from 0.1 nanometres (atomic resolution) up to 1 millimetre.  A synopsis of these techniques is given below.
                  
Scanning Electron Microscopy (SEM)
  • Highly versatile
  • Phase maps – chemical composition (EDS mapping)
  • Crystal structure maps and pole figures (EBSD mapping)
  • Fine particles - size distribution, shape
  • Surface morphology and physical structure (structure details from 5 nm to 1 mm)
  • Data in digital form
Electron Probe
  • Fully quantitative composition (from 1 µm to 1 mm)
  • Mineral identification and mineral liberation
  • Phase identification in metals, ceramics and slags
Transmission Electron Microscopy (TEM)
  • Very high resolution (structure details from 0.2 nm to 10 µm)
  • Semi-quantitative composition maps (from 1 nm to 1 µm)
  • Diffraction effects and electron diffraction
  • Crystal structure of fine-grained or rare materials



TEM image of titanium niobium oxide
Atom-resolution TEM image
Transmission electron microscope images of titanium niobium oxide


SEM of nanotubes
TEM of nanotubes
SEM and TEM images of carbon nanotubes


partial dislocation in silicon
Atomic resolution TEM image of a partial dislocation in silicon (bar = 1 nm)