Micro and nano
characterisation of materials using scanning and transmission electron
microscopy
PicaMS provides a service in micro- and nano- characterisation of
materials using scanning and transmission electron microscopy.
These electron beam techniques provide a highly versatile toolset for
characterisation of materials structure in a sizes ranging from 0.1
nanometres (atomic resolution) up to 1 millimetre. A synopsis of
these techniques is given below.
Scanning Electron
Microscopy (SEM)
- Highly versatile
- Phase maps – chemical composition (EDS mapping)
- Crystal structure maps and pole figures (EBSD mapping)
- Fine particles - size distribution, shape
- Surface morphology and physical structure (structure
details from 5 nm to 1 mm)
- Data in digital form
Electron Probe
- Fully quantitative composition (from 1 µm to 1
mm)
- Mineral identification and mineral liberation
- Phase identification in metals, ceramics and slags
Transmission Electron
Microscopy (TEM)
- Very high resolution (structure details from 0.2 nm
to 10 µm)
- Semi-quantitative composition maps (from 1 nm to 1
µm)
- Diffraction effects and electron diffraction
- Crystal structure of fine-grained or rare materials
Transmission electron
microscope images of titanium niobium oxide
SEM and TEM images of
carbon nanotubes
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Atomic resolution
TEM image of a partial dislocation in silicon (bar = 1 nm)
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